Investigation of displacement of intracranial electrode induced by focused ultrasound stimulation.
Authors: Kim MG, Yu K, Niu X, He B
Transcranial focused ultrasound (tFUS) is an emerging neuromodulation technique to modulate brain activity non-invasively with high spatial specificity and focality. Given the influence of tFUS on brain activity, combining tFUS with multi-channel intracranial electrophysiological recordings enables monitoring of the activity of large populations of neurons with high temporal resolution. However, the physical interactions between tFUS and the electrode may affect a reliable assessment of neuronal activity, which remains poorly understood. In this paper, high-frequency ultrasound (HFUS) system was developed and integrated into tFUS neuromodulation system. The performance of the HFUS-based displacement tracking and analysis was evaluated by the theoretical analysis in the literature. The effects of various pressure levels on the displacements of the silicon-based microelectrode array in <i>ex vivo</i> brain tissue were investigated. The developed approach was capable of tracking and measuring the motion of a solid sphere in a tissue-mimicking phantom and measured displacements were comparable to theoretical predictions. The significant changes in the averaged peak displacements of the microelectrode array in <i>ex vivo</i> brain were observed with a pulse duration of 200 μs and a peak-to-peak pressure from 131 kPa at a center frequency of 500 kHz compared with the values from the negative control group. The present results demonstrate the relationship between several pressure levels and displacements of the microelectrode array in <i>ex vivo</i> brain through the developed approach. This approach can be used to determine a vibration-free threshold of ultrasound parameters in multi-channel intracranial recordings for a reliable assessment of electrophysiological activities of living neurons.
Introduction
Purpose
Transcranial ultrasound stimulation
Study Objective
To develop and validate an HFUS-based method to measure tFUS-induced displacements of silicon microelectrode arrays in ex vivo brain and identify vibration-free ultrasound parameters for reliable intracranial recordings.
Animal model / Human subject
ex vivo brain tissue
Disease model
healthy
MRI or image guidance method
High-frequency ultrasound (HFUS)-based displacement tracking integrated with the tFUS system; no MRI or stereotactic guidance reported.
Outcomes and Safety
Summary of Outcomes
Varying transcranial focused ultrasound pressure levels caused significant displacements of silicon microelectrode arrays in ex vivo brain tissue, establishing a pressure–displacement relationship that can guide vibration-free ultrasound parameters for reliable intracranial electrophysiological recordings.
Safety-related matter
No safety concerns or adverse effects are reported; the paper only examines ultrasound-induced microelectrode displacements in ex vivo brain tissue.
Brain Region
Ultrasound Parameters
Ultrasound instrument
HFUS transducer (U8424004, Olympus America Inc, Waltham, MA, USA), LFUS transducer (AT31529, Blatek Industries, Inc., State College, PA, USA)
FUS Frequency
500 kHz
FUS Pressure
peak-to-peak pressure: 0.131 MPa
FUS Mode
pulsed
Pulse duration
0.2 ms
Focal Characteristics
focal depth: 12.7 mm
Treatment frequency
multiple sessions
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